Celentano G., Rizzo F., Augieri A., Masi A., Barba L., Campi G., Duchenko A., Varsano F., Plaisier J.R., Gigli L., Pompeo F.V.
Rufoloni A., Celentano G., Rizzo F., Augieri A., Pompeo N., Masi A., Barba L., Duchenko A., Varsano F.
Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Ciccioli A., Augieri A., Armenio A.A., Masi A., Barba L., Duchenko A., Varsano F., Plaisier J.R., Gigli L.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Rizzo F., Augieri A., Armenio A.A., Martinelli A., Sotgiu G., Meledin A., Pinto V., Piperno L., Manca N., Cialone M., Iebole M.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Pinto V., Piperno L., Masi A., Campagna E., Salvato M.
Vannozzi A., Celentano G., Rizzo F., Armenio A.A., Pinto V., Domenici F., Orlanducci S., Angelis M.D., Carcione R., Palmieri D., Politi S., Tomellini M.
Ключевые слова: HTS, REBCO, coated conductors, nanodoping, nanorods, critical caracteristics, Jc/B curves, angular dependence, review
Mancini A., Rufoloni A., Vannozzi A., Kursumovic A., MacManus-Driscoll J.L., Celentano G., Tendeloo G.V., Rizzo F., Augieri A., Meledin A., Pinto V., Feighan J., Mayer J.
Ключевые слова: HTS, YBCO, films epitaxial, substrate SrTiO3, nanodoping, nanoscaled effects, PLD process, pinning centers artificial, microstructure, X-ray diffraction, lattice parameter, critical temperature, critical caracteristics, Jc/B curves, growth rate, pinning force, temperature dependence, critical current density, angular dependence, fabrication, experimental results
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor JrT.
Ключевые слова: HTS, YBCO, films, template layers, substrate SrTiO3, nanoscaled effects, microstructure, critical caracteristics, critical current density, fabrication, MOD process, surface, pinning centers artificial, X-ray diffraction, Jc/B curves, angular dependence, pinning force, lattice parameter, magnetic field dependence, experimental results
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, doping effect, nanoscaled effects, defects, surface impedance, vortex dynamics, pinning, defects columnar, experimental results
Vannozzi A., Celentano G., Rizzo F., Armenio A.A., Meledin A., Pinto V., Masi A., Orlanducci S., Santoni A., Ferrarese F.M.
Ключевые слова: HTS, YBCO, films epitaxial, GdBCO, YGdBCO, fabrication, chemical solution deposition, MOD process, substrate SrTiO3, pinning centers artificial, lattice parameter, X-ray diffraction, grain size, composition, microstructure, critical caracteristics, Jc/B curves, critical temperature, irreversibility fields, temperature dependence, critical current density, angular dependence, experimental results
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Jr., Rizzo F., Augieri A., Marzi G.D., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor T. J., Celentano a.G.
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., jr T.P.
Kursumovic A., MacManus-Driscoll J.L., Celentano G., Tendeloo G.V., Rizzo F., Augieri A., Bianchetti M., Meledin A., Sieger M., Hдnisch J., Hьhne R., Opherden L.
Ключевые слова: HTS, REBCO, coated conductors, nanodoping, nanoscaled effects, critical caracteristics, Jc/B curves, temperature distribution, pinning force, thickness dependence, comparison, critical current density, angular dependence, microstructure, PLD process, magnetic field dependence, substrate SrTiO3
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Rubanov S., Armenio A.A., Pinto V.
Petrisor T., Ciontea L., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Nasui M., Pinto V., Piperno L., Gabor M.
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Pinto V., Piperno L.
Ключевые слова: HTS, coated conductors, YBCO, substrate Ni-Cu, substrate Ni-W, substrate Ni-W-Cu, buffer layers, fabrication, PLD process, chemical solution deposition, electron beam evaporation, microstructure, heat treatment, annealing process, grain boundaries, films epitaxial, X-ray diffraction, experimental results
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Armenio A.A., Pinto V., Piperno L., Masi A., Barba L., Arrighetti G., Campi G.
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